Effects of DUV resist sensitivities on lithographic process window
- Author(s):
Kemp,K.G. ( FSI International ) Williams,D.J. Cayton,J.W. Steege,P. Slonaker,S. Elliott,R.C. - Publication title:
- Advances in resist technology and processing XIV : 10-12 March 1997, Santa Clara, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3049
- Pub. Year:
- 1997
- Page(from):
- 955
- Page(to):
- 962
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819424631 [0819424633]
- Language:
- English
- Call no.:
- P63600/3049
- Type:
- Conference Proceedings
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