Taylor,R.S., Leopold,K.E., Fraser,J.W., Feng,Y., Buchanan,M.
SPIE - The International Society for Optical Engineering
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Drews,D., Noell,W., Ehrfeld,W., Lacher,M., Mayr,K., Marti,O., Serwatzy,C., Abraham,M.
SPIE-The International Society for Optical Engineering
|
Walters,D.A., Viani,M., Paloczi,G.T., Schaffer,T.E., Cleveland,J.P., Wendman,M.A., Gurley,G., Elings,V., Hansma,P.K.
SPIE-The International Society for Optical Engineering
|
Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K.
SPIE-The International Society for Optical Engineering
|
Tamiya,E., Iwabuchi,S., Hashigasako,A., Murakami,Y., Sakaguchi,T., Morita,Y., Yokoyama,K.
SPIE - The International Society for Optical Engineering
|
Fujihira M.
Kluwer Academic Publishers
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Tamiya,E., Iwabuchi,S., Murakami,Y., Sakaguchi,T., Yokoyama,K., Chiba,N., Muramatsu,H.
SPIE-The International Society for Optical Engineering
|
P.-K. Wei, W.S. Fann
Society of Photo-optical Instrumentation Engineers
|
K. Dukenbayev, S. K. Sekatskii, D. V. Serebryakov, A. V. Zayats, G. Dietler
SPIE - The International Society of Optical Engineering
|
Bachelot,R., Lahrech,A., Gleyzes,P., Boccara,A.C.
SPIE-The International Society for Optical Engineering
|
Tsai,D.P., Chung,Y.L., Othonos,A.
SPIE-The International Society for Optical Engineering
|
Iwabuchi,S., Hashigasako,A., Morita,Y., Sakaguchi,T., Murakami,Y., Yokoyama,K., Tamiya,E.
SPIE - The International Society for Optical Engineering
|