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X-ray transient monitor for JEM on the International Space Station

Author(s):
Publication title:
EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2808
Pub. Year:
1996
Page(from):
555
Page(to):
562
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421968 [0819421960]
Language:
English
Call no.:
P63600/2808
Type:
Conference Proceedings

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