Blank Cover Image

Damage Estimation and Identification of Structural Faults Using Modal Parameters

Author(s):
Publication title:
Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2768
Pub. Year:
1996
Page(from):
1159
Page(to):
1164
Pub. info.:
Bethel, CT: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780912053493 [0912053496]
Language:
English
Call no.:
P63600/2768
Type:
Conference Proceedings

Similar Items:

Sato,T., Takei,K.

SPIE-The International Society for Optical Engineering

Schwarz,B., Richardson,M.H.

SPIE-The International Society for Optical Engineering

Matsumura,Y., Koizumi,T., Tsujiuchi,N.

SPIE-The International Society for Optical Engineering

Chuang,M.T., Chen,S.Y., Tsuei,Y.G.

Society for Experimental Mechanics

Wodek Gawronski, Jerzy T. Sawicki

American Society of Mechanical Engineers

Perisse,J., Clairet,J.M., Hamet,J.F.

Society for Experimental Mechanics

B.-H. Koh, M.-J. Jeong, U. Jung

Society of Photo-optical Instrumentation Engineers

H. Saitoh, D. Kosemura, Y. Kakemura, T. Yoshida, M. Takei

Electrochemical Society

Saitoh,M., Hayashi,I., Iwatsuki,N.

SPIE-The International Society for Optical Engineering

Johnson, T.J., Yang, C., Adams, D.E., Ciray, S.

SPIE - The International Society of Optical Engineering

T. Kasai, K. Komatsu, M. Sano

Society of Photo-optical Instrumentation Engineers

Koizumi,T., Tsujiuchi,N., Sakai,T., Matsumura,Y.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12