Investigation of a joint transform correlator characteristics for binary pattern recognition
- Author(s):
- Batchevsky,R.S. ( Institute of Physics and Mechanics )
- Muravsky,L.I.
- Stefansky,A.I.
- Fitio,V.M.
- Publication title:
- International Conference on Holography and Correlation Optics : 15-19 May 1995, Chernovtsy, Ukraine
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2647
- Pub. Year:
- 1995
- Page(from):
- 302
- Page(to):
- 306
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819420206 [0819420204]
- Language:
- English
- Call no.:
- P63600/2647
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Evaluation of measuring errors of the surface properties of substances with an optical-digital diagnostic system
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
Identification of a random binary phase mask and its fragments with a joint transform correlator
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Comparative analysis of optical and hybrid joint transform correlators for security applications
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Use of optical astigmatic elements in time delay and frequency multichannel acousto-optic devices for signal optical processing
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Transformed phase mask in a hybrid joint transform correlator for security verification
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Separation of random phase mask in optical correlator for security verification
SPIE |
6
Conference Proceedings
Identification of random phase masks in a nonlinear joint transform correlator
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Binary phase only reference for invariant pattern recognition with the joint transform correlator [6234-19]
SPIE - The International Society of Optical Engineering |