Blank Cover Image

Investigation of a joint transform correlator characteristics for binary pattern recognition

Author(s):
Publication title:
International Conference on Holography and Correlation Optics : 15-19 May 1995, Chernovtsy, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2647
Pub. Year:
1995
Page(from):
302
Page(to):
306
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420206 [0819420204]
Language:
English
Call no.:
P63600/2647
Type:
Conference Proceedings

Similar Items:

Fitio,V.M., Muravsky,L.I., Stefansky,A.I.

SPIE-The International Society for Optical Engineering

Muravsky,L.I.

SPIE-The International Society for Optical Engineering

Muravsky,L.I., Batchevsky,R.S., Stefansky,A.I.

SPIE-The International Society for Optical Engineering

Muravsky,L.I., Shovgenyuk,M.V., Kulynych,Ya.P., Voronyak,T.I., Fityo,T.W.

SPIE - The International Society for Optical Engineering

Muravsky,L.I., Fitio,V.M., Shovgenyuk,M.V., Hlushak,P.A.

SPIE-The International Society for Optical Engineering

Muravsky,L.I., Kulynych,Y.P., Maksymenko,O.P., Voronyak,T.I., Pogan,I.Y., Vladimirov,F.L., Kostyukevych,S.A.

SPIE-The International Society for Optical Engineering

Voronjak,T.I., Batchevsky,R.S., Muravsky,L.I.

SPIE-The International Society for Optical Engineering

Muravsky, L. I., Kostyukevych, S. O., Fitio, V. M., Voronyak, T. I., Shepeliavyi, P. E.

SPIE - The International Society of Optical Engineering

Muravsky,L.L., Kulynych,Y.P., Voronyak,T.I., Fltyo,V.M., Kostyukevych,S.A.

SPIE - The International Society for Optical Engineering

Muravsky, Leonid I., Fitio, Volodymyr M., Shovgenyuk, Mykhajlo V., Hlushak, Petro A.

SPIE

Muravsky,L.I.

SPIE - The International Society for Optical Engineering

Butt, A. J., Wilkinson, D. T.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12