Oblique-incidence reflectometry:one relative profile measurement of diffuse reflectance yields two optical parameters
- Author(s):
Wang,L. ( Univ.Texas M.D.Anderson Cancer Research Ctr. ) Lin,S.-P. Jacques,S.L. Tittel,F.K. Harder,J. Jancarik,J. Mammini,B.M. Small,W.IV Silva,L.B.Da - Publication title:
- Proceedings of optical biopsies : 14-15 September 1995, Barcelona, Spain
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2627
- Pub. Year:
- 1995
- Page(from):
- 165
- Page(to):
- 175
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819419910 [0819419915]
- Language:
- English
- Call no.:
- P63600/2627
- Type:
- Conference Proceedings
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