Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction

Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction

Author(s):: Schwarzer,R.A.
Publication title:: Trends and new applications of thin films : proceedings of the 6th International Symposium on Trends and New Applications of Thin Films (TATF '98), Regensburg, Germany, March 1998
Title of ser.:: Materials science forum
Ser. no.:: 287-288
Pub. Year:: 1998
Page(from):: 23
Page(to):: 60
Pub. info.:: Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:: 02555476
ISBN:: 9780878498154 [087849815X]
Language:: English
Call no.:: M23650
Type:: Conference Proceedings

Details

TDL ID:	ZA00020224
Series ID:	PA00000012
Conf. info. (Name):	International Symposium on Trends and New Applications of Thin Films - TATF
Conf. info. (Number):	1998 : 6th
Conf. info. (Venue):	Regensburg, Germany
Conf. info. (Date):	1998.03.00

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