Cross-Sectional Micro-Raman Spectroscopy:A Tool for Structural Investigations of Thin Polytypic SiC Layers

Cross-Sectional Micro-Raman Spectroscopy:A Tool for Structural Investigations of Thin Polytypic SiC Layers

Author(s):

Publication title:

Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997

Title of ser.:

Materials science forum

Ser. no.:

264-268

Pub. Year:

1998

Vol.:

Part1

Page(from):

661

Page(to):

664

Pub. info.:

Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878497911 [0878497919]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00020223
Series ID:	PA00000012
Conf. info. (Name):	ICSCIII-N : International Conference on Silicon Carbide, III-Nitrides Related Materials
Conf. info. (Number):	1997 : 7th
Conf. info. (Venue):	Stockholm, Sweden
Conf. info. (Date):	1997.09.00

Similar Items:

1 Conference Proceedings THE INITIAL STAGES OF DIAMOND GROWTh ON SI(100) STUDIED BY CONVENTIONAL AND CROSS-SECTIONAL MICRO-RAMAN SPECTROSCOPY Werninghaus, T., Laufer, S., Hinneberg, H.-J., Zahn, D.R.T. Electrochemical Society	7 Conference Proceedings Theoretical and experimental studies of(AIN)1-x(SIC)x layer structures formed by N + and AI + coimplantation in 6H-SiC Kulikov,D.V., Pezoldt,J., Rybin,P.V., Skorupa,W., Trushin,Yu.V., Yankov,R.A. SPIE - The International Society for Optical Engineering
2 Conference Proceedings Raman Spectroscopy Investigation of (SiC)1-x(AlN)x Layers Formed by Ion Implantation in 6H-SiC Zahn, D. R. T., Werninghaus, T., Thumer, M., Pezoldt, J., Heera, V. MRS - Materials Research Society	8 Conference Proceedings Ion Beam Synthesis:A Novel Method of Producing(SiC)1-x(AlN)x Layers Yankov,R.A., Fukarek,W., Voelskow,M., Pezoldt,J., Skorupa,W. Trans Tech Publications
3 Conference Proceedings RHEED: A Tool for Structural Investigations of Thin Polytypic SiC Layers Scharmann, F., Pezoldt, J. Trans Tech Publications	9 Conference Proceedings Raman Spectroscopy of Self-Assembled InAs Quantum Dots in Wide-Bandgap Matrices of AlAs and Aluminium Oxide Tenne, D.A., Milekhin, A.G., Bakarov, A.K., Bajutova, O.R., Haisler, V.A., Toropov, A.I., Schulze, S., Zahn, D.R.T. Materials Research Society
4 Conference Proceedings RHEED: A Tool for Structural Investigations of Thin Polytypic SiC Layers Scharmann, F., Pezoldt, J. Trans Tech Publications	10 Conference Proceedings Formation of Buried Layers of (SiC)1-x(AlN)x in 6H-SiC Using Ion-Beam Synthesis Yankov, R. A., Hatzopoulos, N., Fukarek, W., Voelskow, M., Heera, V., Pezoldt, J., Skorupa, W. MRS - Materials Research Society
5 Conference Proceedings The Measurement of the Thickness of Thin SiC Layers on Silicon Cimalla,V., Scheiner,J., Ecke,G., Friedrich,M., Goldhahn,R., Zahn,D.R.T., Pezoldt,J. Trans Tech Publications	11 Conference Proceedings MBE GROWN GaAs ON Si (100) STUDIED BY INFRARED SPECTROSCOPY Eickhoff, T., Morley, S., Zahn, D.R.T., Richter, W., Woolf, D.A., Westwood, D.I., Wiliams, R.H. Materials Research Society
6 Conference Proceedings Characterization of II-VI Structures by Raman Spectroscopy(invited) Zahn,D.R.T., Geurts,J., Richter,W. Trans Tech Publications	12 Conference Proceedings A Computational Model for the Formation of(SiC)1-x(AlN)x Structures by Hot,High-Dose N+ and Al+ Co-Implants in 6H-SiC Truschin,Yu.V., Yankov,R.A., Kharlamov,V.S., Kulikov,D.V., Tsigankov,D.N., Kreissig,U., Voelskow,M., Pezoldt,J., … Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12