Blank Cover Image

Control of Defects in GaAs/GaInP Interface Grown by MOVPE

Author(s):
Publication title:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
Title of ser.:
Materials science forum
Ser. no.:
196-201
Pub. Year:
1995
Pt.:
1
Page(from):
539
Page(to):
542
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Uchida, Kazuo, Arai, Takayuki, Matsumoto, Koh

MRS - Materials Research Society

H. Yasuda, K. Matsumoto, T. Furukawa, M. Imamura, N. Nitta

Trans Tech Publications

Uchida, K., Yu, P. Y., Zeman, J., Kwok, S. H., Teo, K. L., Su, Z. P., Martinez, G., Arai, T., Matsumoto, K.

MRS - Materials Research Society

Cho, N. -H., McKernan, S., Wagner, D. K., Carter, C. B.

Materials Research Society

Kuan, H.., Shei, S. C., Tzou, W. J., Su, Y. K.

MRS - Materials Research Society

Kurner, W., Dieter, R., Zieger, K., Goroncy, F., Dornen, A., Scholz, F.

MRS - Materials Research Society

Kwok, S. H., Yu, P. Y., Uchida, K., Arai, T.

MRS - Materials Research Society

Uchida, Kazuo, Tokunaga, Hiroki, Inaishi, Yoshiaki, Akutsu, Nakao, Matsumoto, Koh, Itoh, Tsuyoshi, Egawa, Takashi, …

MRS - Materials Research Society

Hou,Y.T., Teo,K.L., Li,M.F., Uchida,K., Tokunaga,H., Akutsu,N., Matsumoto,K.

SPIE - The International Society for Optical Engineering

M. Gotoh, H. Tokunaga, K. Kaneko, T. Arai

SPIE - The International Society of Optical Engineering

Redwing, J. M., Kuech, T. F., Simka, H., Jensen, K. F.

MRS - Materials Research Society

12 Conference Proceedings DEFECTS AND INTERFACES IN GaAs GROWN ON Si

McKernan, S., Zhu, J.G., Carter, C.B., Caridi, E., Schaff, W.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12