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Defect Related Recombination Processes in II-VI Quantum Wells

Author(s):
Godlewski,M.
Bergman,J.P.
Monemar,B.
Koziarska,B.
Suchocki,A.
Karczewski,G.
Wojtowicz,T.
Kossut,J.
Waag,A.
Hommel,D.
5 more
Publication title:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
Title of ser.:
Materials science forum
Ser. no.:
196-201
Pub. Year:
1995
Pt.:
1
Page(from):
455
Page(to):
460
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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