Blank Cover Image

Contactless Characterization of Semiconductors Using Laser-Induced Surface Photo-Charge Voltage Measurements

Author(s):
Abbate,A.
Rencibia,P.
Ivanov,O.
Masini,G.
Palma,F.
Das,P.
1 more
Publication title:
Semiconductor processing and characterization with lasers : applications in photovoltaics : proceedings of the First International Symposium, Stuttgart, Germany, April 18-20, 1994
Title of ser.:
Materials science forum
Ser. no.:
173-174
Pub. Year:
1995
Page(from):
221
Page(to):
226
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496839 [0878496831]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings MATERIAL CHARACTERIZATION BY CONTACTLESS PHOTO-CONDUCTIVITY MEASUREMENTS

Johnson, S.M., Johnson, L.G., Hemphill, R.

Materials Research Society
7 Conference Proceedings *PHOTO-INDUCED REVERSIBLE MODIFICATION OF II-VI SEMICONDUCTOR SURFACE COMPOSITION AND STRUCTURE

Brewer, P.D., Zinck, J.J., Olson, G.L.

Materials Research Society
2 Conference Proceedings Characterization of semiconductor device structures using contactless electromodulation

F.H. Pollak, W. Krystek, M. Leibovitch, S. Moneger, H. Qiang

Society of Photo-optical Instrumentation Engineers
8 Conference Proceedings Contactless sub-millimeter displacement measurements

G. Sliepen, A. P. L. Jägers, F. C. M. Bettonvil, R. H. Hammerschlag

Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings CHARACTERIZATION OF SURFACE CLEANS BY SURFACE PHOTO-VOLTAGE AND SURFACE CHARGE IMAGING

Lowell, John, Wenner, Valerie, Jastrzebski, Lubek

MRS - Materials Research Society
9 Conference Proceedings Semiconductor laser quantum noise measurements using the homodyne balance detector technique

Trifonov,A.S., Usachev,P.A., Ivanov,M.A., Pikhtin,N.A., Tarasov,I.S.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Novel Approach for Silicon Contamination Monitoring Using Surface Photo-voltage Measurements

I. Rapoport, P. Taylor, S. Kim, B. Orschel, W. Huber

Electrochemical Society
10 Conference Proceedings Frequency-Resolved Surface Photo Voltage for Epi Wafer Characterization

Buczkowski,A., Romanowski,A., Kirscht,F.

SPIE - The International Society for Optical Engineering
5 Conference Proceedings Nondestructive room-temperature characterization of wafer-sized ?-? semiconductor device structures using contactless electromodulation and surface photovoltage …

Pollak,F.H.

SPIE - The International Society for Optical Engineering
11 Conference Proceedings PBL Observations and Measurements in the Area of Rome

Abbate G.

Kluwer Academic Publishers
6 Conference Proceedings On-machine characterization of moving paper using a photo-emf laser ultrasonics method

Pouet,B.F., Lafond,E.F., Pufahl,B., Bacher,G.D., Brodeur,P.H., Klein,M.B.

SPIE - The International Society for Optical Engineering
12 Conference Proceedings Contactless Electromodulation for the Characterization of Semiconductor Device Structures

Pollack, F.H., Qiang, H., Yan, D., Chin, Y., Krystek, W., Moneger, S.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12