Observation and Theory of the H2 Defect in Silicon

Author(s):

• Nielsen,B.Bech
• Holbech,J.D.
• Jones,R.
• Sitch,P.
• Oberg,S.(invited)

Publication title:

Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993

Title of ser.:

Materials science forum

Ser. no.:

143-147

Pub. Year:

1994

Vol.:

Pt.2

Page(from):

845

Page(to):

852

Pub. info.:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496716 [0878496718]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings