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Incorporation and Interaction of Hydrogen with Acceptor Impurities in II-VI Semiconductor Compounds

Author(s):
Svob,L.
Marfaing,Y.
Clerjaud,B.
Cote,D.
Ballutaud,D.
Theys,B.
Druilhe,R.
Kuhn,W.
Stanzl,H.
Gebhardt,W.
5 more
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. Year:
1994
Vol.:
Pt.1
Page(from):
447
Page(to):
452
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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