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Infrared and Raman Studies of Carbon Impurities in Highly Doped MBE AlAs:C

Author(s):
Davidson,B.R.
Newman,R.C.
Pritchard,R.E.
Robbie,D.A.
Sangster,M.J.L.
Wagner,J.
Fischer,A.
Ploog,K.
3 more
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. Year:
1994
Vol.:
Pt.1
Page(from):
247
Page(to):
252
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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