Blank Cover Image

Si Doping of GaAs Grown by Molecular Beam Epitaxy on Different Substrate Orientations

Author(s):
Publication title:
Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992
Title of ser.:
Materials science forum
Ser. no.:
117-118
Pub. Year:
1993
Page(from):
387
Page(to):
392
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496549 [0878496548]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Cheng,T.S., Foxon,C.T., Jeffs,N.J., Dewsnip,D.J., Flannery,L.B., Orton,J.W., Harrison,I., Novikov,S.V., Ber,B.Ya., …

Trans Tech Publications

Szafranek, I., Plano, M.A., McCollum, M.J., Jackson, S.L., Stockman, S.A., Cheng, K.Y., Stillman, G.E.

Materials Research Society

Novikov, S.V., Zhao, L.X., Foxon, C.T., Harrison, I., Campion, R.P., Staddon, C.R., Kang, S.W., Kryliouk, O., Anderson, …

Materials Research Society

Novikov, S.V., Zhao, L.X., Foxon, C.T., Ber, B.Ja., Kovarsky, A.P., Harrison, I., Fay, M.W., Brown, P.D.

Materials Research Society

Yang, K., Schowalter, L. J.

Materials Research Society

Werner, P., Schubert, L., Zakharov, N. D., Gerth, G., Kolb, F. M., Gosele, U.(MPI)

Electrochemical Society

Dobbelaere, W., De Boeck, J., De Raedt, W., Vanhellemont, J., Zou, G., Van Hove, M., Brijs, B., Mertens, R., Borghs, G.

Materials Research Society

Gorman, Brian P., Norman, Andrew G., Lukic-Zrnic, Reiko, Gelding, Terry D., Littler, Chris L.

Materials Research Society

As, D.J., Kohler, U., Lischka, K.

Materials Research Society

Ng, H.M

Electrochemical Society

Dykaar, D.R., Eaglesham, D.J., Keil, U.D., Greene, B.I., Saeta, P.N., Pfeiffer, L.N., Kopf, R.F., Darack, S.B., West, …

Materials Research Society

Kryzhanovskaya, N.V., Gladyshev, A.G., Sizov, D.S., Kovsh, A.R., Tsatsul'nikov, A.F., Chi, J.Y., Wang, J.S., Wei, L., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12