Blank Cover Image

CHARACTERIZATION OF DEEP LEVELS BY MICROWAVE ABSORPTION SPECTOROSCOPY.

Author(s):
Publication title:
Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986
Title of ser.:
Materials science forum
Ser. no.:
10-12
Pub. Year:
1986
Vol.:
Part2
Page(from):
521
Page(to):
526
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495511 [0878495517]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Wockinger,J., Jantsch,W., Ferenczi,G.

Trans Tech Publications

Northrop, G.A., Wolford, D.J.

Materials Research Society

Pavelka,T., Ferenczi,G.

Trans Tech Publications

Kang, H.S., Ahn, C.G., Lee, S.H., Kim, K.I., Kang, B.K., Bae, Y.H., Kwon, Y.K.

Electrochemical Society

FERENCZI,G., LONDOS,C.A., PAVELKA,T., SOMOGYI,M., MERTENS,A.

Trans Tech Publications

Aberg, D., Hallen, A., OEsterman, J., Zimmermann, U., Svensson, B.G.

Trans Tech Publications

Deenapanray, P. N. K., Auret, F. D., Ridgway, M. C., Goodman, S. A., Myburg, G.

MRS - Materials Research Society

Mitchel, W.C., Mitchell, W.D., Landis, G.

SPIE - The International Society of Optical Engineering

Ducroquet, F., Guillot, G., Hong, K., Hong, C. H., Pavlidis, D., Gauneau, M.

MRS - Materials Research Society

G. Alfieri, A. Mihaila, H.M. Ayedh, B.G. Svensson, P. Hazdra

Trans Tech Publications

JANTSCH,W., BRUNTHALER,G., HENDOREFER,G.

Trans Tech Publications

Obermeier,G., Hage,J., Hilger,N., Huber,D.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12