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Bayesian classification of multilook polarimetric SAR images with a generalized multiplicative speckle model

Author(s):
  • Liu,G. ( Univ.of Electronic Science and Technology (China) )
  • Huang,S. ( Univ.of Electronic Science and Technology (China) )
  • Torre,A. ( Alenia Spazio SpA (Italy) )
  • Rubertone,F.S. ( Alenia Spazio SpA (Italy) )
Publication title:
Algorithms for synthetic aperture radar imagery IV : 23-24 April 1997, Orlando, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3070
Pub. Year:
1997
Page(from):
398
Page(to):
405
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424853 [0819424854]
Language:
English
Call no.:
P63600/3070
Type:
Conference Proceedings

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