Near-field imaging of the photocurrent on Au/GaAs interface with various wavelengths

Near-field imaging of the photocurrent on Au/GaAs interface with various wavelengths

Author(s):

Davy,S. ( Univ.de Franche-Comte(France) )

Spajer,M. ( Univ.de Franche-Comte(France) )

Courjon,D.A. ( Univ.de Franche-Comte(France) )

Coluzza,C. ( Univ.degli Studi di Roma La Sapienza(Italy) )

Generossi,R. ( Istituto di Struttura della Materia(ItaLy) )

Cricenti,A. ( Istituto di Struttura della Materia(ItaLy) )

Barchesi,C. ( Istituto di Struttura della Materia(ItaLy) )

Almeida,J. ( Swiss Federal Institute of Technology )

Faini,G. ( Lab.des Materiaux Macromoleculaires(France) )

4 more

Publication title:

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3098

Pub. Year:

1997

Page(from):

520

Page(to):

525

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425188 [0819425184]

Language:

English

Call no.:

P63600/3098

Type:

Conference Proceedings

Details

TDL ID:	ZA00020194
Series ID:	PA00000029
Conf. info. (Name):	Lasers, Optics, and Vision for Productivity in Manufacturing : Optical Inspection and Micromeasurements
Conf. info. (Number):	1997 : 2nd
Conf. info. (Venue):	Munich, FRG
Conf. info. (Date):	1997.06.16-1997.06.19

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