Two methods for achieving subpixel resolution in phase difference determination by fringe pattern matching

Two methods for achieving subpixel resolution in phase difference determination by fringe pattern matching

Author(s):

Wang,Z. ( Univ.of Warwick(UK) )
Bryanston-Cross,P.J. ( Univ.of Warwick(UK) )
Pham,D.-P. ( Univ.of Wales Cardiff(UK) )

Publication title:

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3098

Pub. Year:

1997

Page(from):

252

Page(to):

260

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425188 [0819425184]

Language:

English

Call no.:

P63600/3098

Type:

Conference Proceedings

Details

TDL ID:	ZA00020194
Series ID:	PA00000029
Conf. info. (Name):	Lasers, Optics, and Vision for Productivity in Manufacturing : Optical Inspection and Micromeasurements
Conf. info. (Number):	1997 : 2nd
Conf. info. (Venue):	Munich, FRG
Conf. info. (Date):	1997.06.16-1997.06.19

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