Blank Cover Image

High-resolution PITS studies of deep-level defects in semi-insulating GaAs and InP

Author(s):
  • Kaminski,P. ( Institute of Electronic Materials Technology (Poland) )
  • Pawlowski,M. ( Military Univ.of Technology (Poland) )
  • Kozlowski,R. ( Institute of Electronic Materials Technology (Poland) )
  • Cwirko,R. ( Military Univ.of Technology (Poland) )
  • Palczewska,M. ( Institute of Electronic Materials Technology (Poland) )
Publication title:
Solid state crystals, growth and characterization : 7-11 October 1996, Zakopane, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3178
Pub. Year:
1997
Page(from):
246
Page(to):
250
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426048 [0819426040]
Language:
English
Call no.:
P63600/3178
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Digital analysis of photo-induced current transients in semi-insulating GaAs and InP

Kaminski,P., Pawlowski,M., Cwirko,R., Palczewska,M., Kozlowski,R.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Analysis of two-dimensional PITS spectra for characterization of defect centers in high-resistivity materials

Pawlowski,M., Miczuga,M., Kaminski,P., Kozlowski,R.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Deep-level defects in semi-insulating LT MBE GaAs

Kozlowski,R., Kaminski,P., Kordos,P., Pawlowski,M., Cwirko,R.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings High-Resolution Photoinduced Transient Spectroscopy of Defect Centers in Undoped Semi-Insulating 6H-SiC

Pawel Kaminski, Roman Kozlowski, Marcin Miczuga, Michal Pawlowski, Michal Kozubal, Jaroslaw Zelazko

Materials Research Society
3 Conference Proceedings Characterization of point defects in semi-insulating InP:Fe by high-resolution photoinduced transient spectroscopy

Kozlowski, R., Kaminski, P., Pawlowski, M.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Technique of low-frequency noise versus temperature for identification of deep-level defects in semiconductor materials

Cwirko,J., Przybysz,C., Cwirko,R., Kaminski,P.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings CHARACTERIZATION OF DEEP-LEVEL DEFECTS IN SEMI-INSULATING GaAs AND InP BY PHOTOINDUCED TRANSIENT SPECTROSCOPY (PITS)

Kaminski, Pawel

Materials Research Society
10 Conference Proceedings High Resolution DLTS Studies of Transition-Metal-Related Defects in Silicon

Dobaczewski,L., Kaminski,P., Kozlowski,R., Surma,M.

Trans Tech Publications
5 Conference Proceedings Electronic properties of grown-in defects in semi-insulating GaAs

Koztowski,R., Pawiowski,M., Kaminski,P., Cwirko,J.

SPIE - The International Society for Optical Engineering
11 Conference Proceedings Investigation of defect levels in semi-insulating materials by modulated photocurrent (MPC)

Cwirko,J.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Laplace transform photoinduced transient spectroscopy: a new powerful tool for defect characterization in semi-insulating materials

Pawlowski, M., Kaminski, P., Kozlowski, R., Miczuga, M.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Pure and deep-level doped semi-insulating CdTe

Hoschl,P., Grill,R., Franc,J., Belas,E., Turjanska,L., Turkevych,I., Benz,K.W., Fiederle,M.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12