Blank Cover Image

Large-scale form and position error measurement

Author(s):
  • Hao,Q. ( Beijing Institute of Technology (China) )
  • Li,D. ( Tsinghua Univ.(China) )
Publication title:
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3558
Pub. Year:
1998
Page(from):
214
Page(to):
218
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430199 [0819430196]
Language:
English
Call no.:
P63600/3558
Type:
Conference Proceedings

Similar Items:

Song, Y., Hao, Q., Li, D.

SPIE - The International Society of Optical Engineering

B. Wang, X. Yu, Q. Li, Y. Zheng

Society of Photo-optical Instrumentation Engineers

Hao,Q., Cao,M., Zhao,Y., Li,D.

SPIE-The International Society for Optical Engineering

Hao,Y., Zhao,Y., Li,D.

SPIE - The International Society for Optical Engineering

Hao,Q., Liang,R., Cao,M., Li,D.

SPIE-The International Society for Optical Engineering

J. Yang, C. Tian, Q. Liu, H. Yang, Z. Hao

Society of Photo-optical Instrumentation Engineers

4 Conference Proceedings A quick solution of form error by MATLAB

Q. Wang, X. Li, D. Li

SPIE - The International Society of Optical Engineering

S. Jin, Y. Lv, Q. S. Chen

Society of Photo-optical Instrumentation Engineers

Hao,Y., Zhao,Y., Li,D.

SPIE - The International Society for Optical Engineering

Yi,Y., Li,Z., Li,X., Deng,F.

SPIE-The International Society for Optical Engineering

Xie, J.S.

SPIE-The International Society for Optical Engineering

Hao,Q., Zhao,Y., Li,D., Cao,M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12