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Optical method of measuring the thickness of optical films in devices

Author(s):
  • Qian,Y. ( Nanjing Univ.of Science and Technology (China) )
  • Fu,R. ( Nanjing Univ.of Science and Technology (China) )
  • Xu,D. ( Nanjing Univ.of Science and Technology (China) )
  • Chang,B. ( Nanjing Univ.of Science and Technology (China) )
Publication title:
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3558
Pub. Year:
1998
Page(from):
209
Page(to):
213
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430199 [0819430196]
Language:
English
Call no.:
P63600/3558
Type:
Conference Proceedings

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