Grain boundaries of controlled geometry in ZnO films grown by chemical vapor deposition: undoped and bi-doped boundaries

Grain boundaries of controlled geometry in ZnO films grown by chemical vapor deposition: undoped and bi-doped boundaries

Author(s):

Majid, I. ( Department of Materials Science and Engineering, MIT )
Liu, Y. ( Department of Materials Science and Engineering, MIT )
Balluffi, R.W. ( Department of Materials Science and Engineering, MIT )
Sande, J.B. Vander ( Department of Materials Science and Engineering, MIT )

Publication title:

Epitaxial oxide thin films II : symposium held November 26-30, 1995, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

401

Pub. Year:

1996

Page(from):

55

Page(to):

60

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558993044 [1558993045]

Language:

English

Call no.:

M23500/401

Type:

Conference Proceedings

Details

TDL ID:	ZA00020157
Series ID:	PA00000011
Conf. info. (Name):	Symposium on epitaxial oxide thin films
Conf. info. (Number):	2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1995.11.26-1995.11.30

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