Enzel Y., Ely L. L., House K. P., Baker R. V., Duckstein L., Weber J.
Springer-Verlag
|
Lavrik, P. B., Bartnicki, D. E., Feldman, J., Hammond, B. G., Keck, P. J., Love, S. L., Naylor, M. W., Rogan, G. J., …
American Chemical Society
|
Halhoun, R., ?ebe, J.
Kluwer Academic Publishers
|
Zhang, Y., Li, X., Wang, L., Zhang, H.
SPIE-The International Society for Optical Engineering
|
Szczepanska,J., Kmiecik,E., Twardowska,I.
SPIE - The International Society for Optical Engineering
|
Smith L. A., Fisher V. R., Roobol J. M., Wright V. J.
D. Reodel Publishing Company
|
Plate J. E., Duckstein L.
Bogardi Istvan, Kuzelka D.Robert, Ennenga G. Wilma
|
Imhoff K. R.
Sijthoff & Noordhoff International Publishers
|
Hartley, W. R., White, L. E., Bollinger, J. E., Thiyagarajah, A., Mendler, J. M., George, W. J.
American Chemical Society
|
X. Shan, R. van de Velde, J. Wen
ESA Communications
|
McNEIL H. DAVID, DIETRICH R. J., DIXON J.
Kluwer Academic Publishers
|
Stollard, R. J., Rickard, A.
Springer
|