White F. M., Steinebach C., Langas M. P.
Kluwer Academic Publishers
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B. Hu, B. Wang, A. Li, M. Zhang, F. Qin, H. Pan
SPIE - The International Society of Optical Engineering
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White F. M.
Springer-Verlag
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Yang, H., Zhang, H., Hai, J.
SPIE-The International Society for Optical Engineering
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Davia, J. F., Punch, M. F., III, Shum, S. K., Chandrasekaran, B.
American Institute of Chemical Engineers
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Tu, F., Pattipati, K.R., Deb, S., Malepati, V.N.
SPIE-The International Society for Optical Engineering
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Chung, D.T., Modarres, M.
American Institute of Chemical Engineers
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Neubauer, C., Steinebach, M., Siebenhaar, F., Pickel, J.
SPIE-The International Society for Optical Engineering
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Ignacio Yélamos, Moisès Graells, Luis Puigjaner
American Institute of Chemical Engineers
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Shum, Sik K., Kumar, K. Sravana, Davis, James F.
American Institute of Chemical Engineers
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M. Hou, Q. Wu, Y. Liu, Q. Chen
Society of Photo-optical Instrumentation Engineers
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Dervakos, G. A., Hack, C. J., Woodley, J. M., Lilly, M. D.
American Institute of Chemical Engineers
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