High-Resolution Electron Microscopy of Twin-Free ( 111 ) CdTe Layers on Vicinal ( 001 ) GaAs Surfaces

High-Resolution Electron Microscopy of Twin-Free ( 111 ) CdTe Layers on Vicinal ( 001 ) GaAs Surfaces

Author(s):

Publication title:

Point and extended defects in semiconductors

Title of ser.:

NATO ASI series. Series B, Physics

Ser. no.:

202

Pub. Year:

1989

Page(from):

179

Page(to):

182

Pages:

4

Pub. info.:

New York: Plenum Press

ISBN:

9780306433368 [0306433367]

Language:

English

Call no.:

N11479/202

Type:

Conference Proceedings

Details

TDL ID:	ZA00020005
Series ID:	PA00000015
Conf. info. (Name):	NATO Advanced research workshop on on Point, Extended, and Surface Defects in Semiconductors ; International School of Materials Science and Technology ; Workshop on Point, Extended, and Surface Defects in Semiconductors
Conf. info. (Number):	1988 ; 1988 ; 2nd
Conf. info. (Venue):	Erice, Italy
Conf. info. (Date):	1988.11.02-1988.11.07

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