Structural and Chemical Characterization of Semiconductor Interfaces by Hifh-Resolution Transmission Electron Microscopy | 東京工業大学附属図書館文献データベース

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Structural and Chemical Characterization of Semiconductor Interfaces by Hifh-Resolution Transmission Electron Microscopy

Author(s):: Ourmazd A.
Publication title:: Point and extended defects in semiconductors
Title of ser.:: NATO ASI series. Series B, Physics
Ser. no.:: 202
Pub. Year:: 1989
Page(from):: 135
Page(to):: 151
Pages:: 17
Pub. info.:: New York: Plenum Press
ISBN:: 9780306433368 [0306433367]
Language:: English
Call no.:: N11479/202
Type:: Conference Proceedings

Details

TDL ID:	ZA00020005
Series ID:	PA00000015
Conf. info. (Name):	NATO Advanced research workshop on on Point, Extended, and Surface Defects in Semiconductors ; International School of Materials Science and Technology ; Workshop on Point, Extended, and Surface Defects in Semiconductors
Conf. info. (Number):	1988 ; 1988 ; 2nd
Conf. info. (Venue):	Erice, Italy
Conf. info. (Date):	1988.11.02-1988.11.07

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