Blank Cover Image

Scanning thermionic emission imaging of cathode surfaces

Author(s):
Publication title:
Charged particle optics IV : 22-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3777
Pub. Year:
1999
Page(from):
125
Page(to):
132
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432636 [0819432636]
Language:
English
Call no.:
P63600/3777
Type:
Conference Proceedings

Similar Items:

Katsap,V., Sewell,P.B., Wasklewlcz,W.K., Zhu,W.

SPIE - The International Society for Optical Engineering

Stenkamp,D., Kienzle,O., Orchowski,A., Rau,W.D., Weickenmeier,A., Benner,G., Wetzke,M., Waskiewicz,W.K., Katsap,V., …

SPIE-The International Society for Optical Engineering

2 Conference Proceedings Mesh-equipped Wehnelt source for SCALPEL

Katsap,V., Waskiewicz,W.K., Rouse,J.A.

SPIE - The International Society for Optical Engineering

Waskiewicz,W.K., Liddle,J.A.

SPIE-The International Society for Optical Engineering

Waskiewicz,W.K., Liddle,J.A., Katsap,V.

SPIE - The International Society for Optical Engineering

9 Conference Proceedings Emission models for thermionic cathodes

Carpenter,D.C., Simkin,J.

SPIE-The International Society for Optical Engineering

Rouse,J.A., Zhu,X., Munro,E., Liu,H., Waskiewicz,W.K., Katsap,V.

SPIE - The International Society for Optical Engineering

Zhu,X., Munro,E., Rouse,J.A., Waskiewicz,W.K.

SPIE - The International Society for Optical Engineering

Waskiewicz,W.K.

SPIE-The International Society for Optical Engineering

Jones,W.K., Shah,Milind P., Liu,Y.Q.

SPIE - The International Society for Optical Engineering, IMAPS

Moonen,D., Nykerk,M.D., Kruit,P., Waskiewicz,W.K.

SPIE - The International Society for Optical Engineering

Stenkamp,D., Hertfelder,C., Kienzle,O., Orchowski,A., Rau,W.D., Weickenmeier,A., Waskiewicz,W.K.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12