Laterally graded multilayer optics for x-ray analysis
- Author(s):
Schuster,M.R. ( Siemens AG ) Gobel,H. Brugemann,L. Bahr,D. Burgazy,F. Michaelsen,C. Stormer,M. Ricardo,P. Dietsch,R. Holz,T. Mai,H. - Publication title:
- EUV, x-ray, and neutron optics and sources : 21-23 July 1999, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3767
- Pub. Year:
- 1999
- Page(from):
- 183
- Page(to):
- 198
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432537 [0819432539]
- Language:
- English
- Call no.:
- P63600/3767
- Type:
- Conference Proceedings
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