Toward a high-average-power and debris-free soft x-ray source for microlithography pumped by a long-pulse excimer laser
- Author(s):
Bollanti,S ( ENEA Frascati ) Lazzaro,P.Di Flora,F. Letardi,T. Marinai,A. Nottola,A Vigli-Papadaki,K. Vitali,A Bonfigli,F. Lisi,N. Palladino,L. Reale,A. Zheng,C.E. - Publication title:
- EUV, x-ray, and neutron optics and sources : 21-23 July 1999, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3767
- Pub. Year:
- 1999
- Page(from):
- 33
- Page(to):
- 44
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432537 [0819432539]
- Language:
- English
- Call no.:
- P63600/3767
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Soft x-ray plasma source pumped by an excimer laser:optimization and applications
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
"Krypton as filter for ions, debris, and useless radiation in EUV projection lithography systems"
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Large-field high-resolution x-ray monochromatic microscope based on spherical crystals and high-repetition-rate laser-produced plasmas
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
Applications of an x-ray plasma source driven by an excimer laser: in-vivo microscopy,microradiography,and radiobiology
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Atmospheric-pressure soft x-ray source for contact microscopy and radiobiology applications
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Experimental results on silicon annealing by a long-pulse high-power XeCl laser system
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Comparison of beam quality parameters of two high-peak-power excimer laser beams
SPIE-The International Society for Optical Engineering |