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Some ways to improve the recognition of imperfections in large-scale components using shearography

Author(s):
Publication title:
Interferometry '99 : applications : 20-23 September 1999, Pułtusk, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3745
Pub. Year:
1999
Page(from):
244
Page(to):
256
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432278 [081943227X]
Language:
English
Call no.:
P63600/3745
Type:
Conference Proceedings

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