Blank Cover Image

Amplified backscattering from dye-doped polymer bounded with 1D rough metal film

Author(s):
Publication title:
Scattering and surface roughness III : 1-2 August 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4100
Pub. Year:
2000
Page(from):
103
Page(to):
112
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437457 [081943745X]
Language:
English
Call no.:
P63600/4100
Type:
Conference Proceedings

Similar Items:

Peng,G.-D., Gu,Z.-H.

SPIE - The International Society for Optical Engineering

Howell, B.F., Kuzyk, M.G.

SPIE-The International Society for Optical Engineering

Gu,Z.-H., Lu,J.Q.

SPIE-The International Society for Optical Engineering

Gu, Z.-H.

SPIE - The International Society of Optical Engineering

Gu, Z.-H.

SPIE-The International Society for Optical Engineering

Z.-H. Gu, J.M. Bennett

Society of Photo-optical Instrumentation Engineers

Gu,Z.-H.

SPIE-The International Society for Optical Engineering

Savant,G.D., Kostrzewski,A.A., Jannson,T., Kupiec,S.A., Kim,D.H.

SPIE-The International Society for Optical Engineering

J.S. Zuo, C.P. Wei, C.J. Peng, R.Y. He, G.D. Wang

Trans Tech Publications

Yan, M.H., Chen, J.P., Peng, G.D.

SPIE-The International Society for Optical Engineering

Lewis,G.D., Jordan,D.L.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12