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OBSERVATION OF OPEN-ENDED STACKING FAULT TETRAHEDRA IN Si0.85Ge0.15 GROWN ON V-GROOVED (001) Si AND PLANAR (111) Si SUBSTRATES

Author(s):
Publication title:
Defect-interface interactions : symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
319
Pub. Year:
1994
Page(from):
177
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992184 [1558992189]
Language:
English
Call no.:
M23500/319
Type:
Conference Proceedings

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