Blank Cover Image

Interferometric lithography exposure tool for 180-nm structures

Author(s):
Zaidi,S.H. ( Univ.of New Mexico )
Brueck,S.R.J.
Schellenberg,F.M.
Mackay,R.S.
Uekert,K.
Persoff,J.J.
1 more
Publication title:
Emerging lithographic technologies : 10-11 March 1997, Santa Clara, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3048
Pub. Year:
1997
Page(from):
248
Page(to):
254
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424624 [0819424625]
Language:
English
Call no.:
P63600/3048
Type:
Conference Proceedings

Similar Items:

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

Zaidi, S.H., Chu, A-S., Brueck, S.R.J.

Electrochemical Society

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

Brueck, S.R.J., Biswas, A.M.

SPIE - The International Society of Optical Engineering

Zaidi,S.H., Brueck,S.R.J., Hill,T.A., Shagam,R.N.

SPIE-The International Society for Optical Engineering

Chen,X., Brueck,S.R.J.

SPIE-The International Society for Optical Engineering

Chen,X., Zhang,Z., Brueck,S.R.J., Carpio,R.A., Petersen,J.S.

SPIE-The International Society for Optical Engineering

Raub, A.K., Frauenglass, A., Brueck, S.R.J., Conley, W., Dammel, R.R., Romano, A., Sato, M., Hinsberg, W.

SPIE - The International Society of Optical Engineering

Raub, A.K., Brueck, S.R.J.

SPIE-The International Society for Optical Engineering

Biswas, A.M., Frauenglass, A., Brueck, S.R.J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12