Model-based matching using elliptical features

Model-based matching using elliptical features

Author(s):

Burrill,J.R. ( Amerinex Applied Imaging,Inc. )
Wang,S.X.
Barrow,A.
Friedman,M.
Soffen,M.

Publication title:

Automatic object recognition VI : 9-10 April 1996, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2756

Pub. Year:

1996

Page(from):

87

Page(to):

97

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421371 [0819421375]

Language:

English

Call no.:

P63600/2756

Type:

Conference Proceedings

Details

TDL ID:	ZA00019797
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Automatic Object Recognition
Conf. info. (Number):	1996 : 6th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1996.04.09-1996.04.10

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