Bennett, J. M., Kirchner, R. M., Wilson, S. T.
Elsevier
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A. Hashimoto, S. Arie, T. Nomura, K. Higuchi, T. Kojima
Elsevier
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Sears, M., Skeels, G. W., Flanigen, E. M., Bateman, C. A., McGuire, N., Kirchner, R. M.
Elsevier
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Sinha, A. K., Kamble, K. R., Sivasanker, S.
Elsevier
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Broach, R. W., McGuire, N. K., Chao, C. C., Kirchner, R. M.
Elsevier
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Bem, D. S., Bedard, R. L., Broach, R. W., Leon-Escamilla, E. A., Gisselquist, J. L., Pluth, J.
MRS - Materials Research Society
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Wang, C., Li, J., Wang, Y., Wang, K., Yu, J., Xu, R.
Elsevier
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Emilie Brulé, Carine Robert, Christophe M. Thomas
American Chemical Society
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Bailey, W. J., Beam, C. F., Jr., Cappuccilli, E. D., Haddad, I., Volpe, A. A.
American Chemical Society
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Dutta, S., Choudhary, R.N.P., Sinha, P.K.
SPIE - The International Society of Optical Engineering
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Mironov,A.F., Lebedeva,V.S., Yakubovskaya,R.I., Kazachkina,N.I., Fomina,G.I.
SPIE - The International Society for Optical Engineering
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Gomez-Hortiguela, L., Blasco, T., Perez-Pariente, J.
Elsevier
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