Growth,Structure and Interfaces of Cu and Cu/Ti Thin Films on(0001)α-Al2O3
- Author(s):
- Publication title:
- Intergranular and interphase boundaries in materials : iib95 : proceedings of the 7th International Conference on Intergranular and Interphase Boundaries in Materials held in Lisboa, Portugal, June 26-29, 1995
- Title of ser.:
- Materials science forum
- Ser. no.:
- 207-209
- Pub. Year:
- 1996
- Pt.:
- 1
- Page(from):
- 217
- Page(to):
- 220
- Pub. info.:
- Zurich-Uetikon, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497225 [0878497226]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
Similar Items:
Trans Tech Publications |
MRS - Materials Research Society |
2
Conference Proceedings
Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments
MRS - Materials Research Society |
Trans Tech Publications |
MRS - Materials Research Society |
Trans Tech Publications |
4
Conference Proceedings
The Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces
Trans Tech Publications |
MRS - Materials Research Society |
5
Conference Proceedings
Atomic Structure of the Interface between Epitaxial Niobium Films and α-Al2O3 Substrates
Trans Tech Publications |
11
Conference Proceedings
INTERFACIAL ELECTRONIC STRUCTURE AND FULL SPECTRAL HAMAKER CONSTANTS OF Si3N4 INTERGRANULAR FILMS FROM VUV AND SR-VEEL SPECTROSCOPY
MRS - Materials Research Society |
6
Conference Proceedings
Growth and Structure of Ti2O3 and TiO2 Thin Films on (0001) α-Al2O3 Substrates
MRS - Materials Research Society |
MRS - Materials Research Society |