Measurement and parameter extraction of semiconductor lasers-experiences of the pan European action COST 240

Measurement and parameter extraction of semiconductor lasers-experiences of the pan European action COST 240

Author(s):

McDonald, David ( Optronics Ireland, Ireland )
Schatz, Richard
Spano, Paolo
O'Gorman, James

Publication title:

Laser Diodes and Applications III

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3415

Pub. Year:

1998

Page(from):

152

Page(to):

163

Pub. info.:

Bellingham, Wash.: SPIE

ISSN:

0277786X

ISBN:

9780819428691 [0819428698]

Language:

English

Call no.:

P63600/3415

Type:

Conference Proceedings

Details

TDL ID:	ZA00019735
Series ID:	PA00000029
Conf. info. (Name):	Laser diodes and applications
Conf. info. (Number):	1998 : 3rd
Conf. info. (Venue):	Quebec, Canada
Conf. info. (Date):	1998.07.15-1998.07.16

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