Wavelet image processing for optical pattern recognition and feature extraction (Invited Paper)
- Author(s):
- DeCusatis,C.M. ( IBM Corp. (USA) )
- Abbatte,A. ( U.S. Army Benet Labs. (USA) )
- Litynski,D.M. ( U.S. Military Academy (USA) )
- Das,P.K. ( Rensselaer Polytechnic Institute (USA) )
- Publication title:
- 10th Meeting on Optical Engineering in Israel, 2-6 March 1997, Jerusalem, Israel
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3110
- Pub. Year:
- 1997
- Vol.:
- Part 2
- Page(from):
- 804
- Page(to):
- 815
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819425324 [081942532X]
- Language:
- English
- Call no.:
- P63600/3110
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
8
Conference Proceedings
Smart pixel-based wavelet transformation for wideband radar and sonar signal processing
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Wavelet transform:fundamentals,applications,and implementation using acousto-optic correlators
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Experimental results from a smart pixel implementation of the wavelet transformation for signal processing
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering | |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Nanocrystal superlattice imaging by atomic force microscopy (Invited Paper)
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Polymer optical waveguide-based computer backplanes and interconnect [5956-62]
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Rotation,scale,and translation invariant pattern recognition using feature extraction
SPIE-The International Society for Optical Engineering |