Determination of trap depth by analysis of the thermoluminescence peak shape

Author(s):

• Lukas,T. ( Technical Univ.of Lodz (Poland) )
• Opanowicz,A. ( Technical Univ.of Lodz (Poland) )

Publication title:

Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3179

Pub. Year:

1997

Page(from):

310

Page(to):

315

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819426055 [0819426059]

Language:

English

Call no.:

P63600/3179

Type:

Conference Proceedings