Blank Cover Image

Quantitative evaluation and comparison of light microscopes

Author(s):
Publication title:
Optical Investigations of Cells In Vitro and In Vivo
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3260
Pub. Year:
1998
Page(from):
162
Page(to):
173
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426994 [0819426997]
Language:
English
Call no.:
P63600/3260
Type:
Conference Proceedings

Similar Items:

van den Doel, L.R., Moerman, R., van Dedem, G.W.K., Young, I.T., van Vliet, L.J.

SPIE-The International Society for Optical Engineering

Doel,L.R.van den, Vellekoop,M.J., Sarro,P.M., Picioreanu,S., Moerman,R., Frank,J., Dedem,G.W.K.van, Hjelt,K.T., …

SPIE - The International Society for Optical Engineering

2 Conference Proceedings Measurement-based depth of focus

Ellenberger,S.L., Young,I.T.

SPIE-The International Society for Optical Engineering

Lohner,S., Young,I.T., Ellenberger,S.L., Bakker,M.de

SPIE - The International Society for Optical Engineering

Young,I.T., Hjelt,K.T., Doel,R.van den, Vellekoop,M.J., Vliet,L.J.van

SPIE-The International Society for Optical Engineering

Munster,E.B.van, Vliet,L.J.van, Aten,J.A.

SPIE-The International Society for Optical Engineering

Young, I.T., Iordanov, V., Kroon, A., Dietrich, H.R.C., Moerman, R., Doel, L.R., Dedem, G.W.K., Bossche, A., Gray, B.L., …

SPIE-The International Society for Optical Engineering

Ellenberger,S.L., Verweij,A., Knecht,J.P.de

SPIE - The International Society for Optical Engineering

Garini, Y., Kutchoukov, V.G., Bossche, A., Alkemade, P.F.A., Docter, M.W., Verbeek, P.W., van Vliet, L.J., Young, I.T.

SPIE - The International Society of Optical Engineering

Thomsen,S.L., Ryan,T.P., Kuk-Nagle,K., Soto,C., Vancaillie,T.G., Garza-Leal,J.

SPIE-The International Society for Optical Engineering

Kao,F.-J., Chang,L.J., Huang,S.L., Chen,S.-A., Chuang,K.-R., Fann,W.S.

SPIE-The International Society for Optical Engineering

Perelman,L.T., Zonios,G.I., Backman,V., Gurjar,R., Itzkan,I., Dasari,R.R., Dam,J.Van, Feld,M.S.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12