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Convergent beam electron diffraction

Author(s):
HUMPHREYS. C. J  
Publication title:
Impact of electron and scanning probe microscopy on materials research
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
364
Pub. Year:
1999
Page(from):
325
Page(to):
337
Pages:
13
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792359395 [0792359399]
Language:
English
Call no.:
N11482/364
Type:
Conference Proceedings

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