EPR Study of Defects Produced by MeV Ion Implantation into Silicon
- Author(s):
- Publication title:
- Crucial issues in semiconductor materials and processing technologies
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 222
- Pub. Year:
- 1992
- Page(from):
- 445
- Page(to):
- 449
- Pages:
- 5
- Pub. info.:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792320036 [0792320034]
- Language:
- English
- Call no.:
- N11482/222
- Type:
- Conference Proceedings
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