Tserpe, E., Waugh, K. C.
Elsevier
|
Waugh A. David, Taylor M. Martin
Springer
|
Morokuma K., Yamashita K., Yabushita S.
Kluwer Academic Publishers
|
Foloppe N., Breton J., Smith C. J.
Plenum Press
|
Y.-H. Fang, C. Corbari, X.-N. Zhang, M. Mancini
ESA Communications
|
Piechowska, K., Bacchus-Montabonel, M. -C., Tergiman, Y. S., Sienkiewicz, J. E.
SPIE - The International Society of Optical Engineering
|
Eilbeck J. C., Fruter J. E.
Kluwer
|
Russel, K. C.
North-Holland
|
Hadden, R. A., Howe, J. C., Waugh, K. C.
Elsevier
|
Waugh,S.E., Terentis,A.C., Metha,G.F., Kable,S.H.
SPIE-The International Society for Optical Engineering
|
Prakash, M. C., Prabhakara Rao, G. V., Sridharan, K. S.
SPIE - The International Society of Optical Engineering
|
Kang, S. J., Yi, Y., Kim, C. Y, Noh, M, Jeong, K., Yoo, K., Whang, C. N.
SPIE - The International Society of Optical Engineering
|