CASSONE M. VINCENT, BROOKS S. DAVID, HODGES B. DONALD, KELM A. TERESA, JUN LU, WARREN S. WADE
Kluwer Academic Publishers
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Schroder, H., Bauer, J., Ebling, F., Franke, M., Beier, A., Demmer, P., Sullau, W., Kostelnik, J., Modinger, R., …
SPIE - The International Society of Optical Engineering
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Figueiro, M.G., Bullough, J.D., Rea, M.S.
SPIE - The International Society of Optical Engineering
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Lewy J. A., Sack L. R., Ahmed S., Bauer K. V., Blood L. M.
Plenum Press
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Dubocovich L. M., Krause N. D., Iacob S., Benloucif S., Masana I. M.
Plenum Press
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Eiche, C., Joerger, W., Fiederle, M., Schwarz, R., Salk, M., Ebling, D. G., Benz, K. W.
MRS - Materials Research Society
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Folkard S., Monk H. T.
Martinus Nijhoff Publishers
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A. Beier, H. Schröder, N. Arndt-Staufenbiel, F. Ebling, M. Franke
Society of Photo-optical Instrumentation Engineers
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Potts, J. D., Hastings, K. E., Chillingworth, R. S., Unger, H.
American Chemical Society
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C. Eiche, R. Schwarz, W. Joerger, M. Fiederle, D.G. Ebling
Society of Photo-optical Instrumentation Engineers
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T. Otto, J. Nestler, M. Baum, H. Schroeder, F. Ebling, R. Bruch, T. Gessner
SPIE - The International Society of Optical Engineering
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Groh R. Kenneth, Ehret F. Charles, Eisler, Jr. J. William, LeBuis A. Donald
Martinus Nijhoff Publishers
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