Blank Cover Image

Spectrally resolved white-light interferometry for profilometry with polarization phase shifter

Author(s):
Publication title:
Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3897
Pub. Year:
1999
Page(from):
713
Page(to):
718
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434999 [081943499X]
Language:
English
Call no.:
P63600/3897
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Polarization phase shifting in white-light interferometry

Helen,S.Suja, Kothiyal,M.P., Sirohi,R.S.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings Versatile electronic speckle pattern interferometry

Sirohi,R.S.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings An improved achromatic half-wave plate phase shifter for white light interferometry

S. H. Simson, M. P. Kothiyal, R. S. Sirohi

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Double shear speckle interferometry for curvature measurement

Ganesan,A.R., Murukeshan,V.M., Meinlschmidt,P., Sirohi,R.S.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Thickness-profile measurement of transparent thin-film layers by spectrally resolved phase- shifting interferometry [6292-42]

Debnath, S. K., Kothiyal, M. P., Schmit, J., Hariharan, P.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Achromatic phase shifting for polarization interferometry

Hariharan,P., Roy,M.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Analysis of spectrally resolved white light interferometry by Hilbert Transform method [6292-26]

Debnath, S. K., Kothiyal, M. P.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Nondestructive evaluation of fiber-reinforced polymer composites by an all-fiber-optic phase-shifting electronic speckle pattern interferometer

Murukeshan,V.M., Ganesan,A.R., Sirohi,R.S., Malhotra,S.K.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Improved collimation testing with a multiple beam wedge plate late ral shear interferometer

P. Senthikumaran, K.V. Sriram, M.P. Kothiyal, R.S. Sirohi

Society of Photo-optical Instrumentation Engineers
11 Conference Proceedings Use of monochromatic phase data for improved profile measurement in spectrally resolved white light interferometry [5879-19]

Debnath, S.K., Sharma,. D. K., Kothiyai, M. P.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Experimental characterization of photorefractive beam coupling in BaTi03 crystal at multiple wavelengths

Ara,M.H.Majles, Vijayan,C., Mohan,N.Krishna, Kothiyal,M.P., Sirohi,R.S.

SPIE - The International Society for Optical Engineering
12 Conference Proceedings Spectral polarization signatures of materials in the LWIR

Fetrow,M.P., Sposato,S.H., Bishop,K.P., Caudill,T.R.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12