CD-R and CD-RW optical disk characterization in response to intense light sources

Author(s):

• Akhavan,F. ( Optical Sciences Ctr./Univ.of Arizona )
• Milster,T.D.

Publication title:

Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3806

Pub. Year:

1999

Page(from):

84

Page(to):

92

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432926 [081943292X]

Language:

English

Call no.:

P63600/3806

Type:

Conference Proceedings