Variation in optical disk retardance measurements

Author(s):

• Rochford,K.B. ( National Institute of Standards and Technology )
• Kreger,S.T.
• West,J.W.

Publication title:

Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3806

Pub. Year:

1999

Page(from):

36

Page(to):

40

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432926 [081943292X]

Language:

English

Call no.:

P63600/3806

Type:

Conference Proceedings