Description of the FAR XITE(fine-angular-resolution x-ray imaging telescope,"far-sight")optics and science objectives
- Author(s):
Ulmer,M.P. ( Northwestern Univ. ) Rothschild,R.E. Altkorn,R.I. Gruber,D.E. Heindl,W.A. Hink,P.L. Krieger,A.S. Matteson,J.L. Matz,S.M. Staubert,R. - Publication title:
- X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3766
- Pub. Year:
- 1999
- Page(from):
- 221
- Page(to):
- 232
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432520 [0819432520]
- Language:
- English
- Call no.:
- P63600/3766
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Description of the FAR-XITE(Fine Angular Resolution X-ray Imaging Telescope,"far-sight")optics and science objectives:an update
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Actively shielded CZT focal plane detectors for the Fine Angular Resolution X-ray Imaging Telescope(FAR XITE)
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Fabrication of Wolter I multilayer coated optics via electroforming:an update
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Development of a coded-aperture backscatter imager using the UC San Diego HEXIS detector
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |