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Semiautomatic quality determination of 3D confocal microscope scans of neuronal cells denoised by 3D-wavelet shrinkage

Author(s):
Publication title:
Wavelet Applications VI
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3723
Pub. Year:
1999
Page(from):
446
Page(to):
457
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431974 [0819431974]
Language:
English
Call no.:
P63600/3723
Type:
Conference Proceedings

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